Search results for "Industrial inspection"
showing 2 items of 2 documents
SVM approximation for real-time image segmentation by using an improved hyperrectangles-based method
2003
A real-time implementation of an approximation of the support vector machine (SVM) decision rule is proposed. This method is based on an improvement of a supervised classification method using hyperrectangles, which is useful for real-time image segmentation. The final decision combines the accuracy of the SVM learning algorithm and the speed of a hyperrectangles-based method. We review the principles of the classification methods and we evaluate the hardware implementation cost of each method. We present the combination algorithm, which consists of rejecting ambiguities in the learning set using SVM decision, before using the learning step of the hyperrectangles-based method. We present re…
Gabor filters in industrial inspection: a review. Application to semiconductor industry
2005
This paper focuses on reviewing some recent works of the use of Gabor filters dealing with industrial applications. After a brief recall of Gabor filter basis, the two usual uses of Gabor filters are recalled: filter bank approach and filter design approach. The third part presents recent published works domain by domain. A fourth part exposes our own work with Gabor Filters for defect detection on semiconductor. A short conclusion summarizes the paper.